"\\mu=110 \\\\\n\ns^2 = 9 \\\\\n\ns=3\\\\\n\nn=20 \\\\\n\n\\bar{x} = 125 \\\\\n\n\u03b1=0.01 \\\\\n\nH_0: \\mu=110 \\\\\n\nH_1: \\mu>110"
(a) Since, n<30 and "\\sigma" is unknown then we are using T-test statistic
"t = \\frac{\\bar{x} - \\mu}{s \/ \\sqrt{n}} \\\\\n\nt = \\frac{125-110}{3\/ \\sqrt{20}} = 22.36 \\\\\n\ndf=n-1=20-1=19 \\\\\n\nt_{0.01,19} = 2.539\\\\\n\nt> t_{0.01,19}"
We reject H0.
(b) P-value approach.
"t=22.6 \\\\\n\ndf=n-1=19"
Using Excel formula
The EXCEL formula to find the p-value for a one-tailed t-test and df=19 is
=tdist(22.6, 19, 1)
p-value "= 2.07 \\times 10^{-15}"
p ≈ 0<α=0.01
Reject H0.
Therefore, there is not enough evidence to conclude that a new manufacturing method is supposed to increase the average life span of electronic components, while the variance of the life span is expected to stay the same at 0.01 significance level.
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