1. The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 13 defectives.
a. Calculate a 95% two-sided CI on the fraction of non-defective circuits produced by this particular tool.
b. Calculate a 90% upper confidence bound on the fraction of defective circuits.
Number of defective = 13
Total number of circuits = 300
a) Proportion of defective integrated circuits
"\\hat{p} = \\frac{x}{n}= \\frac{13}{300}= 0.0433"
We will use Noramal distribution
"np= 300 \\times 0.0433 = 13 \\\\\n\nn(1-p) = 300 \\times (1-0.0433) = 287"
95% two sided CI will be:
"\\hat{p} -Z_{0.025} \\sqrt{ \\frac{\\hat{p}(1- \\hat{p})}{n}} \u2264 p \u2264 \\hat{p} + Z_{0.025} \\sqrt{ \\frac{\\hat{p}(1- \\hat{p})}{n}} \\\\\n\nZ_{0.025} = 1.96 \\;(from \\;table) \\\\\n\n0.0433 - 1.96 \\times 0.011 \u2264 p \u2264 0.0433 + 1.96 \\times 0.011 \\\\\n\n0.02274 \u2264 p \u2264 0.06486"
b) 95% upper confidence bound
"p \u2264 \\hat{p} + Z_{0.05} \\sqrt{\\frac{\\hat{p}(1- \\hat{p})}{n}} \\\\\n\nZ_{0.05}= 1.645 \\\\\n\np \u2264 0.0433 + 1.945 \\sqrt{\\frac{0.0433 \\times 0.9567}{300}} \\\\\n\np \u2264 0.0627"
Comments
Leave a comment