A semiconductor manufacturer produces controllers used in automobile engine applications. The customer required that the process fallout or fraction defective at a critical manufacturing step not exceed 0.05 and that the manufacturer demonstrate process capacity at this level of quality using α = 0.05. The semiconductor manufacturer takes a random sample of 200 devices and finds that four of them are defective. Can tha manufaturer demonstrate process capability for the customer?
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Expert's answer
2020-05-14T16:08:09-0400
We need to test H0:p=0.05 against H1:p<0.05. The test statistic is
z=np(1−p)X−np
Given n=200,X=4
z=200(0.05)(1−0.05)4−200(0.05)≈−1.946657
The critical value is zc=z1−α=−1.645. Rhe rejection region is z<−1.645.
Since z=−1.946657<−1.645, we reject H0, and we can conclude that there is enough evidence to support the fact that the process fallout does not exceed.
Note that p-value P(Z≤−1.946657)=0.025788. Since p − value =0.025788<0.05=α, we reject H0, and we can conclude that there is enough evidence to support the fact that the process fallout does not exceed.
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