Question #115473
A semiconductor manufacturer produces controllers used in automobile engine applications. The customer required that the process fallout or fraction defective at a critical manufacturing step not exceed 0.05 and that the manufacturer demonstrate process capacity at this level of quality using α = 0.05. The semiconductor manufacturer takes a random sample of 200 devices and finds that four of them are defective. Can tha manufaturer demonstrate process capability for the customer?
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Expert's answer
2020-05-14T16:08:09-0400

 We need to test H0:p=0.05H_0:p=0.05 against H1:p<0.05.H_1:p<0.05. The test statistic is 


z=Xnpnp(1p)z={X-np\over \sqrt{np(1-p)}}

Given n=200,X=4n=200, X=4


z=4200(0.05)200(0.05)(10.05)1.946657z={4-200(0.05)\over \sqrt{200(0.05)(1-0.05)}}\approx-1.946657


The critical value is zc=z1α=1.645.z_c=z_{1-\alpha}=-1.645. Rhe rejection region is z<1.645.z<-1.645.

Since z=1.946657<1.645,z=-1.946657<-1.645, we reject H0,H_0, and we can conclude that there is enough evidence to support the fact that the process fallout does not exceed.

Note that p-value P(Z1.946657)=0.025788.P(Z\leq-1.946657)=0.025788.  Since p − value =0.025788<0.05=α,=0.025788<0.05=\alpha, we reject H0,H_0, and we can conclude that there is enough evidence to support the fact that the process fallout does not exceed.



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